PARSIPPANY — Brandon Yip, a student at Central Middle School, has been honored as one of the brightest students in the world by the Johns Hopkins Center for Talented Youth.
Yip was honored for exceptional performance on the SAT, ACT, School and College Ability Test, or a similar assessment taken as part of the Center for Talented Youth Talent Search. The center uses above-grade-level testing to identify advanced students from around the world and provide a clear picture of their academic abilities.
Each year, about sixteen thousand students from more than seventy-five countries join the Center for Talented Youth. On average, less than thirty percent of students who join qualify for either high or grand honors based on their test scores.
“This is not just recognition of students’ performance on one test, but a testament to their curiosity and capacity for learning,” said Amy Lynne Shelton, PhD, the center’s executive director. “These students have demonstrated enormous potential, and now we encourage them to seek out experiences and communities that help them challenge and stretch their knowledge, connect with other young scholars, understand diverse perspectives, think critically, and pursue their goals confidently.”
Yip has also earned access to the center’s rigorous, hands-on, day, residential, and online courses, which are offered in a range of subjects including History and Social Science, Language Arts, Mathematics, Robotics and Technology, and Science and Engineering.
The Center for Talented Youth, a nonprofit academic center of Johns Hopkins University, has been a global leader in gifted education since nineteen seventy-nine. The center identifies and nurtures the academic talents of advanced learners in grades two through twelve through accredited, challenging courses, research, and advocacy. Its community includes students, educators, alumni, and supporters from across the United States and more than seventy-five countries. The center is committed to welcoming bright students from all backgrounds. More information is available at cty.jhu.edu.
